Future of EMC testing in components, IoT and Automotive industry

When:
February 13, 2018 @ 5:30 pm – 7:45 pm America/Los Angeles Timezone
2018-02-13T17:30:00-08:00
2018-02-13T19:45:00-08:00
Where:
City: sunnyvale
Contact:
caroline.chan.us@ieee.org

Can you imagine the world without Electronic devices? Today’s electronic gadgets, machines and appliances have become an integral part of our lives. The more electronic devices that these technologies (e.g. 5G & IoT) interact and co-exist with, the greater the potential for disturbance (RF interference) among them. The largest challenge for these emerging applications will be RF compliance, not only with regard to regulatory requirements, but also there will be greater emphasis on operational environments to ensure proper performance, and public safety. These emerging technologies will continue to grow and influence commercial, automotive, and defense industries through 2020. This presentation will discuss new product features and methodology requiring greater awareness of the EMC environment in which they operate, and new test approaches

Speaker(s): Sangam Baligar,

Location:
1293 Anvilwood Ave.
sunnyvale, California